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 N-SIM E

N-SIM E

Utilizing structured illumination microscopy (SIM) technology, the all-new N-SIM E realizes double the spatial resolution of conventional optical microscopes (to approximately 115 nm).

N-SIM E is a streamlined, affordable super-resolution system supporting only essential, commonly used excitation wavelengths and imaging modes, making it an obvious choice for individual labs.


N-SIM E

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